In today's ever-changing environment, business success requires a company to be able to anticipate opportunities and effectively understand and respond to risks.

Organizations are feeling pressure on all sides to enhance their risk management practices. External stakeholders—such as regulators, ratings agencies, investors, lenders, and trading partners—often seek data or performance metrics related to an organization's risk management framework. They may incorporate this information into their assessments of the organization's resilience and its likely future financial performance. At the same time, various internal stakeholders—such as boards of directors, audit committees, executive management committees, and employees—are exerting greater influence on risk leaders to integrate an understanding of the organization's myriad risks into key strategic decisions.

In 2011, in response to these pressures, Aon plc collaborated with the Wharton School of the University of Pennsylvania to launch the Aon Risk Maturity Index, an online questionnaire that assesses, benchmarks, and tracks the development of different organizations' risk management frameworks over time. It also provides a platform for the collection of global data on corporate risk management practices across a consistent set of parameters.

Complete your profile to continue reading and get FREE access to Treasury & Risk, part of your ALM digital membership.

  • Critical Treasury & Risk information including in-depth analysis of treasury and finance best practices, case studies with corporate innovators, informative newsletters, educational webcasts and videos, and resources from industry leaders.
  • Exclusive discounts on ALM and Treasury & Risk events.
  • Access to other award-winning ALM websites including PropertyCasualty360.com and Law.com.
NOT FOR REPRINT

© 2024 ALM Global, LLC, All Rights Reserved. Request academic re-use from www.copyright.com. All other uses, submit a request to [email protected]. For more information visit Asset & Logo Licensing.